[75] J. Park, J. Bae, Y.-S Jang and J. Jin, “Thickness measurements and uncertainty evaluation of a multilayer thin-film samples using auxiliary single-layer samples”, Metrologia 60(2),025007, 2023

[74] Y.-S Jang, J. Park and J. Jin, “Comb-mode resolved spectral domain interferometer enabled by a broadband electro-optic frequency comb”, Photonics Research 11(1),72-80, 2023

[73] J. Lee and J. Jin, “Thickness and refractive index measurement of a thin-film using an artificial neural network algorithm”, Metrologia 60(2),025001, 2023

[72] Y.-S. Jang, J. Park and J. Jin, "Full C-band wavelength-tunable, 250 MHz repeatition rate mode-locked polarization-maintaining fiber laser," Scientific Reports, 13, 3623, 2023.

[71] Y.-S. Jang, J. Park and J. Jin, "Linear-cavity Er-doped fiber mode-locked laser with large wavelength tunability," Applied Optics 61(34), 10116-10120, 2022.

[70] J. Lee and J. Jin, “A novel method to design and evaluate artificial neural network for thin film thickness measurement traceable to the length standard”, Scientific Reports 12,2212, 2022

[69] Y.-S. Jang, J. Park and J. Jin, "Periodic-error-free all-fiber distance measurement method with photonic microwave modulation towards on-chip based devises," IEEE Transactions on Instrumentation and Measurement 71, 7000709, 2022

[68] *Y.-S. Jang, *H. Liu, J. Yang, M. Yu, D.-L. Kwong, and C. W. Wong, "Nanometric precision distance metrology via hybrid spectrally-resolved and homodyne interferometry in a single soliton frequency microcomb," Physical Review Letters 126(2), 023903, 2021 (*: co-first author)

[67] J. Bae, J. Park, H. Ahn, and J. Jin “Optical method for simultaneous thickness measurements of two layers with a significant thickness difference,” Optics Express 29(20), 31615-31631, 2021

[66] Y.-S. Jang, J. Park and J. Jin, "Sub 100-nm precision distance measurement by means of all-fiber photonic microwave mixing," Optics Express 29(8), 12229-12239, 2021

[65] A. Hirai, Y. Bitou, J. Bae, J. Park, and J. “Precise measurement of the thickness of silicon wafers by double-sided interferometer and bilateral comparison” Metrologia 58(5), 054002, 2021

[64] W. Kim, H. Fu, S. Han, K. Lee, Y.-S. Jang and, S.-W. Kim, "Photonic microwave distance interferometry using a mode-locked laser with systematic error correction," Applied Science 10, 7649, 2020

[63] J. Park, J. Bae, Y.-S. Jang, and J. Jin, “A novel method for simultaneous measurement of thickness, refractive index, bow, and warp of a large silicon wafer using a spectral-domain interferometer,” Metrologia, 57, 064001, 2020

[62] J. Park, H. Mori, Y.-S. Jang, and J. Jin, “Precise thickness profile measurement insensitive to spatial and temporal temperature gradients on a large glass substrate,” Applied Optics, 59(20), 5881-5887, 2020

[61] J.-A. Kim, J.W. Kim, J. Y. Lee, C.-S. Kang, and J. Jin, “On-machine calibration of angular position and runout of a precision rotation stage using two absolute position sensors” Measurement, 153(1), 1-7, 2020

[60] H. Jang, B. S. Kim, B. J. Chun, H. J. Kang, Y.-S. Jang, Y. W. Kim, Y.-J. Kim, and S.-W. Kim, "Comb-rooted multi-channel synthesis of ultra-narrow optical frequencies of few Hz linewidth," Scientific Reports 9, 7652, 2019

[59] J. Park, H. Mori, and J. Jin, “Simultaneous measurement method of the physical thickness and group refractive index free from a non-measurable range,” Optics Express 27(17), 24682-24692, 2019

[58] J.-A. Kim, J.W. Kim, J. Y. Lee, C.-S. Kang, and J. Jin, “High-resolution angle sensor using multiple peak positions of a double slit interference pattern,” Review of Scientific Instruments 90, 045001, 2019

[57] J. Park, J.-A. Kim, H. Ahn, J. Bae, and J. Jin, “A Review of Thickness Measurements of Thick Transparent Layers using Optical Interferometry,” International Journal of Precision Engineering and Manufacturing 20(3), 463-477, 2019 (Invited Review Paper)

[56] J. Park, J. Bae, J.-A. Kim and J. Jin, “Physical thickness and group refractive index measurement of individual layers for double-stacked microstructures using spectral-domain interferometry,” Optics Communications 431, 181-186, 2019

[55] Y.-S. Jang and S.-W. Kim, "Distance measurements using mode-locked lasers - a review," Nanomanufacturing and Metrology 1(3), 131-147, 2018

[54] Y.-S. Jang, W. Kim, H. Jang and S.-W. Kim, "Absolute distance meter operating on a free-running mode-locked laser for space mission," International Journal of Precision Engineering and Manufacturing 19(7), 975-981, 2018

[53] H. Ahn, J. Bae, J. Park, and J. Jin, “A hybrid non-destructive measuring method of three-dimensional profile of through silicon vias for realization of smart devices,” Scientific Reports 8, 15342, 2018

[52] J.-A. Kim, J.W. Kim, C.-S. Kang, and J. Jin, “Note: An absolute X-Y-Theta position sensor using a two-dimensional phase-encoded binary scale,” Review of Scientific Instruments 89(4), 046105, 2018

[51] J.-A. Kim, J.W. Kim, C.-S. Kang, J. Jin, and T.B. Eom, “Interferometric profile scanning system for measuring large planar mirror surface based on single-interferogram analysis using Fourier transform method,” Measurement 118, 113-119, 2018

[50] Y.-S. Jang and S.-W. Kim, "Compensation of the refractive index of air in laser interferometer for distance measurement: a review," International Journal of Precision Engineering and Manufacturing 18(12), 1881-1890, 2017

[49] C. Lee, H. Choi, J. Kim, M. Cha, and J. Jin, “Wavelength measurement by Fourier analysis of interference fringes through a plane parallel plate,” Applied Optics 56(35), 9638, 2017

[48] J. Bae, J. Park, H. Ahn, and J. Jin, “Total physical thickness measurement of a multi-layered wafer using a spectral-domain interferometer with an optical comb,” Optics Express 25(11), 12689, 2017

[47] J.-A. Kim, J.W. Kim, C.-S. Kang, J. Jin, and J.Y. Lee, “An interferometric system for measuring thickness of parallel glass plates without 2π ambiguity using phase analysis of quadrature Haidinger fringes,” Review of Scientific Instruments 88, 055108, 2017

[46] S. Chun, J. Jin and W.-H. Cho, “Construction of the prediction model between pressure and flow rate for pulsating flows based on the Greenfield-Fly model concerning wave dispersion,” Experiments in Fluids 58:37, 2017

[45] Y.-S. Jang, G. Wang, S. Hyun, H. J. Kang, B. J. Chun, Y.-J. Kim, and S.-W. Kim, "Comb-referenced laser distance interferometer for industrial nanotechnology," Scientific Reports 6, 31770, 2016

[44] J. Park, J. Jin, J.-A. Kim and J.W. Kim, “Absolute distance measurement method without a non-measurable range and directional ambiguity based on the spectral-domain interferometer using the optical comb of the femtosecond pulse laser,” Applied Physics Letters 109, 244103-1-5, 2016

[43] H. Ahn, J. Park, J.-A. Kim and J. Jin, “Optical Fiber-Based Confocal and Interferometric System for Measuring the Depth and Diameter of Through Silicon Vias,” Journal of Lightwave technology 34(23), 5462-5466, 2016

[42] C. Lee, H. Choi, J. Jin and M. Cha, “Measurement of refractive index dispersion of a fused silica plate using Fabry-Perot interference,” Applied Optics 55(23), 6285-6291, 2016

[41] J. Jin, “Dimensional metrology using the optical comb of a mode-locked laser,” Measurement Science and Technology 27, 22001-22017, 2016 (Invited Review Paper / Cover paper)

[40] J.-A. Kim, J.W. Kim, C.S. Kang, J. Jin, and T.B. Eom, “Absolute angle measurement using a phase-encoded binary graduated disk,” Measurement 80, 288-293, 2016

[39] K. Lee, J. Lee, Y.-S. Jang, S. Han, H. Jang, Y.-J. Kim, and S.-W. Kim, "Broadband Fourier-transform spectroscopy using Er-doped fiber femtosecond laser by sweeping the pulse repetition rate," Scientific Reports 5, 15726, 2015

[38] H. Jang, Y.-S. Jang, S. Kim, K. Lee, S. Han, Y.-J. Kim, and S.-W. Kim, "Polarization maintaining linear cavity Er-doped fiber femtosecond laser," Laser Physics Letters 12(10), 105102, 2015

[37] †H. J. Kang, †B. J. Chun, Y.-S. Jang, Y.-J. Kim, and S.-W. Kim, "Real-time compensation of the refractive index of air in distance measurement," Optics Express 23(20), 26377-26385, 2015

[36] *Y.-S. Jang, *G. Wang, S. Hyun, B. J. Chun, H. J. Kang, S. Yan, Y.-J. Kim, and S.-W. Kim, "Absolute positioning by multi-wavelength interferometry referenced to the frequency comb of a femtosecond laser," Optics Express 23(7), 9121-9129, 2015 (*: co-first author)

[35] J. Park, J. Jin, J. Bae, J.-A. Kim, and J.W. Kim, “Vibration-insensitive measurements of the thickness profile of large glass panels,” Optics Express, 23(26), 32941-32949, 2015

[34] J.-A. Kim, J.W. Kim, C.S. Kang, J. Jin, and T.B. Eom, “High-speed double-slit interferometer using a position sensitive detector for in-line thickness variation measurement of glass panels,” International Journal of Precision Engineering and Manufacturing, 16(9), 1955-1961, 2015

[33] C.-S. Kang, J.A. Kim, J. Jin, T.B. Eom, and J.W. Kim, “An optical straightness measurement sensor for the KRISS watt balance,”
Measurement, 61, 257-262, 2015

[32] Y.-S. Jang, K. Lee, S. Han, J. Lee, Y.-J. Kim and S.-W. Kim, "Absolute distance measurement with extension of nonambiguity range using the frequency comb of a femtosecond laser," Optical Engineering 53(12), 122403, 2014

[31] J. Lee, K. Lee, Y.-S. Jang, H. Jang, S. Han, S.-H. Lee, K.-I. Kang, C.-W. Lim, Y.-J. Kim and S.-W. Kim, "Testing of a femtosecond pulse laser in outer space," Scientific Reports 4, 5134, 2014

[30] Y.-S. Jang, J. Lee, S. Kim, K. Lee, S. Han, Y.-J. Kim and S.-W. Kim, "Space radiation test of saturable absorber for femtosecond laser," Optics Letters 39(10), 2831-2834, 2014

[29] S.S. Jung, B.S. Jeon, J. Jin, and Y.B. Lee, “Measurement of the loss factor and the Young's modulus in acrylonitrile butadiene styrene and Polymethyl Methacrylate by using an acoustic wave generator,” International Journal of Precision Engineering and Manufacturing, 15(12), 2493-2497, 2014

[28] J. Jin, S.R. Maeng, J. Park, J.-A. Kim, and J.W. Kim, “Fizeau-type interferometric probe to measure geometrical thickness of silicon wafers,” Optics Express, 22(19), 23427-23432, 2014

[27] J-A. Kim, C.-S. Kang, T.B. Eom, J. Jin, and H.S. Suh, “Quadrature laser interferometer for in-line thickness measurement of glass panels using a current modulation technique,” Applied Optics, 53(20), 4604-4610, 2014

[26] J.-A. Kim, J. W. Kim, T.B. Eom, J. Jin, and C.-S. Kang, “Vibration-insensitive measurement of thickness variation of glass panels using double-slit interferometry,” Optics Express, 22(6), 6486-6494, 2014

[25] J. Park, J. Jin, J.W. Kim, and J.-A. Kim, “Measurement of thickness profile and refractive index variation of a silicon wafer using the optical comb of a femtosecond pulse laser,” Optics Communications, 305(20), 170-174, 2013

[24] J.-A. Kim, J. W. Kim, C.-S. Kang, J. Jin, and T. B. Eom, “Nonlinearity error compensated absolute planar position measurement using a two-dimensional phase-encoded binary grating,” Review of Scientific Instrument, 84(5), 1-3, 2013

[23] J. Park, L. Chen, Q. Wang, and U. Griesmann, "Modified Roberts-Langenbeck test for measuring thickness and refractive index variation of silicon wafers," Optics Express, 20(18), 20078-20089, 2012

[22] J.-A. Kim, J. W. Kim, C.-S. Kang, J. Jin, and T. B. Eom, “An optical absolute position measurement method using a phase-encoded single track binary code,” Review of Scientific Instrument, 83(11), 1-6, 2012

[21] S. Maeng, J. Park, J. Jin, and B. O, “Uncertainty improvement of geometrical thickness and refractive index measurement of a silicon wafer using a femtosecond pulse laser,” Optics Express, 20, 12184-12190, 2012

[20] S. Kim, J. Jin, Y. -J. Kim, I. -Y. Park, Y. Kim, and S. -W. Kim, “Kim et al. reply: Nanostructure-enhanced atomic line emission,” Brief communication arising, Nature, 485, E1-E3, 2012

[19] J. Jin, J. -W. Kim, C. -S. Kang, J. –A. Kim, and S. Lee, “Precision depth measurement of through silicon vias (TSVs) on 3D semiconductor packaging process,” Optics Express, 20, 5011-5016, 2012

[18] J.-A. Kim, J. W. Kim, C. –S. Kang, J. Jin, and T. B. Eom, “An optical absolute position measurement method using a phase-encoded single track binary,” Review of Scientific Instrument, 83, 115115, 2012

[17] S. Chun, and J. Jin, “Output power measurement of a blood pump considering pulsating flows,” Journal of Mechanical Science and Technology, 26, 793-798, 2012

[16] J. Jin, J. -W. Kim, C. -S. Kang, J. –A. Kim, and S. Lee, “Precision depth measurement of through silicon vias (TSVs) on 3D semiconductor packaging process,” Optics Express, 20, 5011-5016, 2012

[15] J. –A. Kim, J. -W. Kim, C. -S. Kang, J. Jin, and T. B. Eom, “High precision angle generator using multiple ultrasonic motors and a self-calibratable encoder,” Review of Scientific Instrument, 82, 086108, 2011

[14] J. –A. Kim, C. -S. Kang, J. Jin, C. I. Eom, R. Jang, and J. -W. Kim, “High speed optical profiler based on a phase-shifting technique using frequency-scanning lasers” Review of Scientific Instrument, 82, 086111, 2011

[13] J. –A. Kim, J. -W. Kim, C. -S. Kang, J. Jin, and T. B. Eom, “An interferometric calibration system for various linear artefacts using active compensation of angular motion errors,” Measurement Science and Technology, 22, 075304, 2011

[12] J. Park and S.-W. Kim, “Active autofocus control using source dithering technique based on fibre-optic confocal principle,” International Journal of Precision Engineering and Manufacturing, 12(4), 733-736, 2011

[11] J. Jin, J. -W. Kim, C. -S. Kang, and J. –A. Kim, “Visibility enhanced interferometer based on an injection-locking technique for low refractive materials,” Optics Express, 18, 23517-23522, 2010

[10] J. Jin, J. -W. Kim, C. -S. Kang, J. –A. Kim, and T. B. Eom, “Thickness and refractive index measurement of a silicon wafer based on an optical comb,” Optics Express, 18, 18339-18346, 2010

[9] J. Park and S.-W. Kim, “Vibration-desensitized interferometer by continuous phase shifting with high-speed fringe capturing,” Optics Letters, 35(1), 19-21, 2010

[8] J. Jin, H. -G. Rhee, and S. -W. Kim, “Metrological atomic force microscopy integrated with a modified two-point diffraction interferometer,” Measurement Science and Technology, 20, 105302, 2009

[7] S. Hyun, Y. -J. Kim, Y. Kim, J. Jin, and S. –W. Kim, “Absolute length measurement with the frequency comb of a femtosecond laser,” Measurement Science and Technology, 20, 095302, 2009

[6] J. Park, J. You, and S.-W. Kim, “Vibration-desensitized fiber-diffraction interferometer for industrial surface measurement,” CIRP Annals - Manufacturing Technology, 58(1), 473-476, 2009

[5] *S. Kim, *J. Jin, Y. -J. Kim, I. -Y. Park, Y. Kim, and S. –W. Kim, “High-harmonic generation by resonant plasmon field enhancement,” Nature, 453, 757-760, 2008 (*: co-first author)

[4] Y. –J. Kim, J. Jin, Y, Kim, and S.-W. Kim, “A wide-range optical frequency generator based on the frequency comb of a femtosecond laser,” Optics Express, 16(1), 258-264, 2008

[3] J. Jin, Y. -J. Kim, Y. Kim, and S. -W. Kim “Absolute Distance Measurement using the Optical Comb of a Femtosecond Pulse Laser,” International Journal of Precision Engineering and Manufacturing, 8(4), 22-26, 2007

[2] J. Jin, Y. -J. Kim, Y. Kim, S. -W. Kim, and C. -S. Kang, “Absolute Length Calibration of Gauge Blocks using the Optical Comb of a Femtosecond Pulse Laser,” Optics Express, 14(13), 5568-5974, 2006

[1] J. Jin, I. Misumi, S. Gonda, and T. Kurosawa, “Pitch Measurement of 150 nm 1D-grating Standards using an Nano-metrological Atomic Force Microscope,” International Journal of Precision Engineering and Manufacturing, 5(3), 19-25, 2004